Abstract
Recent experiments [B. Stojetz et al., Phys. Rev. Lett. 94, 186802 (2005)] show that weak localization in multiwall carbon nanotubes is suppressed at some values of the gate voltage. Using the one-dimensional formula for the conductance corrections due to weak localization, the corresponding phase coherence length was determined there as a function of the gate voltage. We consider the decoherence due to electron-electron scattering and calculate numerically the corresponding coherence time. We show that the coherence length becomes particularly short—i.e., comparable to or even shorter than the elastic mean free path due to scattering on imperfections (defects and∕or inner-shell-induced disturbances) at gate voltages corresponding to the onset of new populated subbands of the outermost nanotube shell. Suppression of the phase coherence length at these points with increasing gate voltage leads to suppression of the corresponding weak-localization corrections, which is consistent with the experimental observations.
- Received 15 February 2007
DOI:https://doi.org/10.1103/PhysRevB.75.195422
©2007 American Physical Society