Electron diffusion in polymer:fullerene bulk heterojunctions

Pieter A. C. Quist, Tom J. Savenije, Juleon M. Schins, Jessica E. Kroeze, Paul A. Rijkers, and Laurens D. A. Siebbeles
Phys. Rev. B 75, 195317 – Published 15 May 2007

Abstract

A method to study the bulk electron diffusion dynamics in poly(2-methoxy-5-(3, 7-dimethyloctyloxy)-1,4-phenylene-vinylene): 1-(3-methoxycarbonyl)-propyl-1-phenyl-(6,6) C61 (PCBM) blend films with varying PCBM content is presented. The blends are spin coated on top of dense smooth TiO2 and excited with a visible laser pulse. The photogenerated electrons on PCBM diffuse through the blend film until they reach the interface with TiO2, which serves to collect the electrons. The resulting change in conductance of TiO2 is measured using the time-resolved microwave conductivity technique. Theoretical analysis of the time-dependent photoconductance gives the electron diffusion constant (De) and the lower limit of the time for electrons to decay by trapping or recombination (τe). De increases from 7.0×1013m2s at a weight fraction PCBM (WPCBM)=0.11to3.5×1010m2s at WPCBM=0.50, while, interestingly, at WPCBM=0.75, a smaller value of 1.2×1010m2s is found. The electron diffusion length increases with PCBM content. The presence of PCBM clusters in blends with a high PCBM content extends the time for electrons to decay, so that the lower limit of the electron diffusion length exceeds the film thickness of 100nm, which is required for sufficient light absorption in a photovoltaic device.

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  • Received 10 November 2006

DOI:https://doi.org/10.1103/PhysRevB.75.195317

©2007 American Physical Society

Authors & Affiliations

Pieter A. C. Quist, Tom J. Savenije*, Juleon M. Schins, Jessica E. Kroeze, Paul A. Rijkers, and Laurens D. A. Siebbeles

  • Optoelectronic Materials Section, DelftChemTech, Faculty of Applied Sciences, Delft University of Technology, Julianalaan 136, NL-2628 BL Delft, The Netherlands

  • *Corresponding author. Electronic address: t.j.savenije@tudelft.nl

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Issue

Vol. 75, Iss. 19 — 15 May 2007

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