Point-contact spectroscopy of Al- and C-doped MgB2: Superconducting energy gaps and scattering studies

P. Szabó, P. Samuely, Z. Pribulová, M. Angst, S. Bud’ko, P. C. Canfield, and J. Marcus
Phys. Rev. B 75, 144507 – Published 17 April 2007

Abstract

The two-band and/or two-gap superconductivity in aluminum- and carbon-doped MgB2 has been addressed by the point-contact spectroscopy. Two gaps are preserved in all samples with Tcs down to 22K. The evolution of two gaps as a function of the critical temperature in the doped systems suggests the dominance of the band-filling effects, but for the increased Al doping, the enhanced interband scattering must also be considered. The extraction of the zero-energy density of states for the π and σ bands using a simple physical model demonstrates that significant changes in the relative weighting of the intraband scattering are created in the case of the C doping with the scattering in the π band enhanced faster than in the σ one. The Al doping does not change the relative weight of the scatterings within the bands.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 21 March 2006

DOI:https://doi.org/10.1103/PhysRevB.75.144507

©2007 American Physical Society

Authors & Affiliations

P. Szabó1, P. Samuely1, Z. Pribulová1, M. Angst2, S. Bud’ko2, P. C. Canfield2, and J. Marcus3

  • 1Centre of Low Temperature Physics, IEP Slovak Academy of Sciences and P. J. Šafárik University, Watsonova 47, SK-04001 Košice, Slovakia
  • 2Ames Laboratory, Iowa State University, Ames, Iowa 50011, USA
  • 3LEPES CNRS, F-38042 Grenoble Cedex 9, France

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 75, Iss. 14 — 1 April 2007

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×