Superconductivity in gallium-substituted Ba8Si46 clathrates

Yang Li, Ruihong Zhang, Yang Liu, Ning Chen, Z. P. Luo, Xingqiao Ma, Guohui Cao, Z. S. Feng, Chia-Ren Hu, and Joseph H. Ross, Jr.
Phys. Rev. B 75, 054513 – Published 16 February 2007

Abstract

We report a joint experimental and theoretical investigation of superconductivity in Ga-substituted type-I silicon clathrates. We prepared samples of the general formula Ba8Si46xGax, with different values of x. We show that Ba8Si40Ga6 is a bulk superconductor, with an onset at TC3.3K. For x=10 and higher, no superconductivity was observed down to T=1.8K. This represents a strong suppression of superconductivity with increasing Ga content, compared to Ba8Si46 with TC8K. Suppression of superconductivity can be attributed primarily to a decrease in the density of states at the Fermi level, caused by a reduced integrity of the sp3-hybridized networks as well as the lowering of carrier concentration. These results are corroborated by first-principles calculations, which show that Ga substitution results in a large decrease of the electronic density of states at the Fermi level, which explains the decreased superconducting critical temperature within the BCS framework. To further characterize the superconducting state, we carried out magnetic measurements showing Ba8Si40Ga6 to be a type-II superconductor. The critical magnetic fields were measured to be HC135Oe and HC28.5kOe. We deduce the London penetration depth λ3700Å and the coherence length ξc200Å. Our estimate of the electron-phonon coupling reveals that Ba8Si40Ga6 is a moderate phonon-mediated BCS superconductor.

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  • Received 25 October 2006

DOI:https://doi.org/10.1103/PhysRevB.75.054513

©2007 American Physical Society

Authors & Affiliations

Yang Li1,2,3,*, Ruihong Zhang1, Yang Liu1, Ning Chen1, Z. P. Luo4, Xingqiao Ma1, Guohui Cao1, Z. S. Feng5, Chia-Ren Hu3, and Joseph H. Ross, Jr.3,*

  • 1Department of Physics, University of Science and Technology Beijing, Beijing 100083, China
  • 2Department of Engineering Science and Materials, University of Puerto Rico at Mayaguez, Mayaguez, Puerto Rico 00681-9044, USA
  • 3Department of Physics, Texas A&M University, College Station, Texas 77843-4242, USA
  • 4Microscopy and Imaging Center, Texas A&M University, College Station, Texas 77843-2257, USA
  • 5Department of Mathematics, University of Texas–Pan American, Edinburg, Texas 78541, USA

  • *Corresponding author. Electronic address: ylibp@hotmail.com
  • Corresponding author. Electronic address: jhross@tamu.edu

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Issue

Vol. 75, Iss. 5 — 1 February 2007

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