Kinetic Monte Carlo simulations of ion-induced ripple formation: Dependence on flux, temperature, and defect concentration in the linear regime

E. Chason, W. L. Chan, and M. S. Bharathi
Phys. Rev. B 74, 224103 – Published 11 December 2006

Abstract

Low-energy ion bombardment produces spontaneous periodic structures (sputter ripples) on many surfaces. Continuum theories describe the pattern formation in terms of ion-surface interactions and surface relaxation kinetics, but many features of these models (such as defect concentration) are unknown or difficult to determine. In this work, we present results of kinetic Monte Carlo simulations that model surface evolution using discrete atomistic versions of the physical processes included in the continuum theories. From simulations over a range of parameters, we obtain the dependence of the ripple growth rate, wavelength, and velocity on the ion flux and temperature. The results are discussed in terms of the thermally dependent concentration and diffusivity of ion-induced surface defects. We find that in the early stages of ripple formation the simulation results are surprisingly well described by the predictions of the continuum theory, in spite of simplifying approximations used in the continuum model.

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  • Received 20 September 2005

DOI:https://doi.org/10.1103/PhysRevB.74.224103

©2006 American Physical Society

Authors & Affiliations

E. Chason, W. L. Chan, and M. S. Bharathi

  • Division of Engineering, Brown University, Providence, Rhode Island 02912, USA

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Issue

Vol. 74, Iss. 22 — 1 December 2006

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