Relativistic effects in core-loss electron diffraction

Christian Dwyer and Jonathan S. Barnard
Phys. Rev. B 74, 064106 – Published 9 August 2006

Abstract

We present experimental evidence of relativistic fine structure in inelastic electron diffraction patterns of a crystalline solid at zone-axis orientation. Diffraction patterns formed by 200keV electrons suffering energy losses within 10eV of the silicon K-ionization edge at ⟨001⟩ zone axis exhibit excellent agreement with a relativistic theory of atomic ionization. Such agreement provides experimental confirmation of the theoretical approach, used in an earlier investigation, suggesting that relativistic effects should be taken into account when performing quantitative core-loss spectroscopy on individual atomic columns in the scanning transmission electron microscope.

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  • Received 28 April 2006

DOI:https://doi.org/10.1103/PhysRevB.74.064106

©2006 American Physical Society

Authors & Affiliations

Christian Dwyer* and Jonathan S. Barnard

  • Department of Materials Science and Metallurgy, University of Cambridge, Cambridge CB2 3QZ, United Kingdom

  • *Electronic address: christian.dwyer@materials.ox.ac.uk. Present address: Department of Materials, University of Oxford, Oxford OX1 3PH, United Kingdom.

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Vol. 74, Iss. 6 — 1 August 2006

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