Abstract
We present experimental evidence of relativistic fine structure in inelastic electron diffraction patterns of a crystalline solid at zone-axis orientation. Diffraction patterns formed by electrons suffering energy losses within of the silicon -ionization edge at ⟨001⟩ zone axis exhibit excellent agreement with a relativistic theory of atomic ionization. Such agreement provides experimental confirmation of the theoretical approach, used in an earlier investigation, suggesting that relativistic effects should be taken into account when performing quantitative core-loss spectroscopy on individual atomic columns in the scanning transmission electron microscope.
- Received 28 April 2006
DOI:https://doi.org/10.1103/PhysRevB.74.064106
©2006 American Physical Society