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Bandwidth-disorder phase diagram of half-doped layered manganites

R. Mathieu, M. Uchida, Y. Kaneko, J. P. He, X. Z. Yu, R. Kumai, T. Arima, Y. Tomioka, A. Asamitsu, Y. Matsui, and Y. Tokura
Phys. Rev. B 74, 020404(R) – Published 27 July 2006

Abstract

Phase diagrams in the plane of rA (the average ionic radius, related to the one-electron bandwidth W) and σ2 (the ionic radius variance, measuring the quenched disorder), or bandwidth-disorder phase diagrams, have been established for perovskite manganites, with a three-dimensional (3D) Mn-O network. Here we establish the intrinsic bandwidth-disorder phase diagram of half-doped layered manganites with a two-dimensional (2D) Mn-O network, examining in detail the parent state of the colossal magnetoresistance phenomenon in crystals without ferromagnetic instability. The consequences of the reduced dimensionality, from 3D to 2D, for the order-disorder phenomena in the charge-orbital sectors are also highlighted.

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  • Received 28 June 2006

DOI:https://doi.org/10.1103/PhysRevB.74.020404

©2006 American Physical Society

Authors & Affiliations

R. Mathieu1,*, M. Uchida1, Y. Kaneko1, J. P. He1, X. Z. Yu1, R. Kumai2, T. Arima1,3, Y. Tomioka2, A. Asamitsu1,4, Y. Matsui1,5, and Y. Tokura1,2,6

  • 1Spin Superstructure Project (ERATO-SSS), JST, AIST Central 4, Tsukuba 305-8562, Japan
  • 2Correlated Electron Research Center (CERC), AIST Central 4, Tsukuba 305-8562, Japan
  • 3Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
  • 4Cryogenic Research Center (CRC), University of Tokyo, Bunkyo-ku, Tokyo 113-0032, Japan
  • 5Advanced Materials Laboratory, National Institute for Materials Science (NIMS), Tsukuba 305-0044, Japan
  • 6Department of Applied Physics, University of Tokyo, Tokyo 113-8656, Japan

  • *Present address: Department of Microelectronics and Applied Physics, Condensed Matter Physics Group (KMF), Royal Institute of Technology (KTH), Electrum 229, SE-164 40 Kista, Sweden. Electronic address: rmathieu@kth.se

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Vol. 74, Iss. 2 — 1 July 2006

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