First-principles investigation of a bistable boron-oxygen interstitial pair in Si

A. Carvalho, R. Jones, M. Sanati, S. K. Estreicher, J. Coutinho, and P. R. Briddon
Phys. Rev. B 73, 245210 – Published 15 June 2006

Abstract

Local density functional calculations are used to predict and compare the properties of the two distinct interstitial boron-interstitial oxygen (BiOi) complexes recently reported in the literature. The electronic and free energies, as well as the small transformation barrier, suggest that both forms of the defect are present at the temperature at which the defect forms. The vibrational spectra of the defects are predicted. The electrical levels of the defect are calculated and compared to experimental data. The existence of two forms of the BiOi defect may have implications for the lifetime degradation of space-based Czochralski-silicon solar cells.

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  • Received 21 March 2006

DOI:https://doi.org/10.1103/PhysRevB.73.245210

©2006 American Physical Society

Authors & Affiliations

A. Carvalho* and R. Jones

  • School of Physics, University of Exeter, Stocker Road, Exeter, EX4 4QL, United Kingdom

M. Sanati and S. K. Estreicher

  • Physics Department, Texas Tech University, Lubbock, Texas 79409-1051, USA

J. Coutinho

  • Department of Physics, University of Aveiro, Campus Santiago 3810-193 Aveiro, Portugal

P. R. Briddon

  • School of Natural Sciences, University of Newcastle upon Tyne, Newcastle upon Tyne, NE1 7RU, United Kingdom

  • *Electronic address: carvalho@excc.ex.ac.uk

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Issue

Vol. 73, Iss. 24 — 15 June 2006

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