Finite-element analysis of a silicon-based double quantum dot structure

S. Rahman, J. Gorman, C. H. W. Barnes, D. A. Williams, and H. P. Langtangen
Phys. Rev. B 73, 233307 – Published 19 June 2006

Abstract

We present finite-element solutions of the Laplace equation for the silicon-based trench-isolated double quantum dot and the capacitively-coupled single-electron transistor device architecture. This system is a candidate for charge and spin-based quantum computation in the solid state, as demonstrated by recent coherent-charge oscillation experiments. Our key findings demonstrate control of the electric potential and electric field in the vicinity of the double quantum dot by the electric potential applied to the in-plane gates. This constitutes a useful theoretical analysis of the silicon-based architecture for quantum information processing applications.

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  • Received 26 December 2005

DOI:https://doi.org/10.1103/PhysRevB.73.233307

©2006 American Physical Society

Authors & Affiliations

S. Rahman1,*, J. Gorman1, C. H. W. Barnes1, D. A. Williams2, and H. P. Langtangen3

  • 1Cavendish Laboratory, Cambridge University, J J Thomson Avenue, Cambridge, CB3 OHE, United Kingdom
  • 2Hitachi Cambridge Laboratory, J J Thomson Avenue, Cambridge, CB3 OHE, United Kingdom
  • 3Simula Research Laboratory, Martin Linges v 17, Fornebu P.O.Box 134, 1325 Lysaker, Norway

  • *Electronic address: S.Rahman.00@cantab.net

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Vol. 73, Iss. 23 — 15 June 2006

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