Orientation of fluorophenols on Si(111) by near edge x-ray absorption fine structure spectroscopy

Fan Zheng, J. L. McChesney, Xiaosong Liu, and F. J. Himpsel
Phys. Rev. B 73, 205315 – Published 9 May 2006

Abstract

The adsorption of phenol, 4-fluorophenol, and 2,3,4-trifluorophenol on the Si(111)7×7 surface is investigated by near edge x-ray absorption fine structure spectroscopy (NEXAFS). A strong polarization dependence of the π* transitions is observed for fluorinated phenols, while phenol itself is more isotropic. A quantitative method is developed to convert polarization-dependent NEXAFS data into orientational information for such a situation. The model includes two angular degrees of freedom, the tilt angle γ of the end group and its rotation angle β around the phenyl-to-oxygen bond. The tilt is fixed by the geometry of the free molecule, while the rotation is characterized by an average angle β0 with a Gaussian distribution σ due to thermal fluctuations. The model is applicable to a variety of self-assembled monolayers with tailored end groups that are used in molecular electronics and biosensors.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 18 December 2005

DOI:https://doi.org/10.1103/PhysRevB.73.205315

©2006 American Physical Society

Authors & Affiliations

Fan Zheng, J. L. McChesney*, Xiaosong Liu, and F. J. Himpsel

  • Department of Physics, University of Wisconsin–Madison, 1150 University Avenue, Madison, Wisconsin 53706, USA

  • *Present address: Lawrence Berkeley National Laboratory, Berkeley, CA 94720-8225.
  • Corresponding author. Email address: fhimpsel@wisc.edu

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 73, Iss. 20 — 15 May 2006

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×