Temperature dependence of magnetoresistance in magnetic tunnel junctions with different free layer structures

L. Yuan, S. H. Liou, and Dexin Wang
Phys. Rev. B 73, 134403 – Published 3 April 2006

Abstract

The temperature and bias voltage dependence of magnetoresistance and the resistance of two types of magnetic tunnel junction (MTJ) samples were studied. These two types of MTJ samples have different free layer structures, while having the same pinned layer structures and with the same material for free and reference layers. The layer structure for type 1 MTJs is 80Ru8CoFeB15Al2O350CoFeB9Ru54FeCo350CrMnPt (in angstroms). The layer structure for type 2 MTJs is 80Ru40CoFeB50RuTa40CoFeB15Al2O350CoFeB9Ru54FeCo350CrMnPt. The tunneling magnetoresistance (TMR) ratio [(RAPRP)RP] is about 26% and 69% at room temperature for type 1 and type 2 MTJs, respectively. A TMR as high as 107% has been observed for type 2 MTJ samples at 13K. By analysis of the voltage and temperature dependence of the resistance and magnetoresistance in these MTJs, we discuss the effects of the magnetic behavior of the free layers, barrier qualities, and barrier interfaces. The results clearly indicate that the micromagnetization orientation at the interface between the free layer and the barrier layer is one of the important factors that determines the TMR ratio.

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  • Received 10 November 2005

DOI:https://doi.org/10.1103/PhysRevB.73.134403

©2006 American Physical Society

Authors & Affiliations

L. Yuan and S. H. Liou

  • Department of Physics and Astronomy and Center for Materials Research and Analysis, University of Nebraska-Lincoln, Lincoln, Nebraska 68588-0111, USA

Dexin Wang

  • NVE Corporation, 11409 Valley View Road, Eden Prairie, Minnesota 55344, USA

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Issue

Vol. 73, Iss. 13 — 1 April 2006

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