Magnetoresistance and spin polarization in the insulating regime of a Si two-dimensional electron system

Mitsuaki Ooya, Kiyohiko Toyama, and Tohru Okamoto
Phys. Rev. B 72, 075344 – Published 17 August 2005

Abstract

We have studied the magnetoresistance in a high-mobility Si inversion layer down to low electron concentrations at which the longitudinal resistivity ρxx has an activated temperature dependence. The angle of the magnetic field was controlled so as to study the orbital effect proportional to the perpendicular component B for various total strengths Btot. A dip in ρxx, which corresponds to the Landau level filling factor of ν=4, survives even for high resistivity of ρxx108Ω at T=150mK. The linear Btot dependence of the value of B at the dip for low Btot indicates that a ferromagnetic instability does not occur even in the far insulating regime.

    • Received 26 May 2005

    DOI:https://doi.org/10.1103/PhysRevB.72.075344

    ©2005 American Physical Society

    Authors & Affiliations

    Mitsuaki Ooya, Kiyohiko Toyama, and Tohru Okamoto

    • Department of Physics, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan

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    Issue

    Vol. 72, Iss. 7 — 15 August 2005

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