Thickness dependence of surface plasmon damping and dispersion in ultrathin Ag films

Yinghui Yu, Ying Jiang, Zhe Tang, Qinlin Guo, Jinfeng Jia, Qikun Xue, Kehui Wu, and Enge Wang
Phys. Rev. B 72, 205405 – Published 3 November 2005

Abstract

The thickness dependence of the surface plasmon damping and dispersion of atomically flat and ultrathin silver films deposited on the Si(111)(7×7) surface was investigated by a combined high-resolution electron-energy-loss spectroscopy (HREELS) and scanning tunneling microscopy (STM) system. We found stronger plasmon energy dispersion with the momentum parallel to the surface (q) in thicker films, and a significant dependence of the damping edge on the film thickness. Both of them can be associated with the presence of quantum well states (QWS) in the direction perpendicular to the film surface, which influences the interband transitions between the lower and upper 5sp bands of silver.

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  • Received 16 May 2005

DOI:https://doi.org/10.1103/PhysRevB.72.205405

©2005 American Physical Society

Authors & Affiliations

Yinghui Yu, Ying Jiang, Zhe Tang, Qinlin Guo, Jinfeng Jia, Qikun Xue, Kehui Wu*, and Enge Wang

  • State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, P. O. Box 603-20, Beijing 100080, China

  • *Author to whom correspondence should be addressed. Electronic address: khwu@aphy.iphy.ac.cn

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Vol. 72, Iss. 20 — 15 November 2005

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