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Encapsulation of atomic-scale Bi wires in epitaxial silicon without loss of structure

Osami Sakata, Wataru Yashiro, D. R. Bowler, Akiko Kitano, Kunihiro Sakamoto, and Kazushi Miki
Phys. Rev. B 72, 121407(R) – Published 26 September 2005

Abstract

We demonstrate, using x-ray diffraction, that we have taken one-dimensional Bi nanolines fabricated on a Si(001) surface, and buried them in crystalline silicon while retaining both their one-dimensional characters and important aspects of their structure. In particular, after burial, the nanolines retain the two-by periodicity associated with their surface structure along their length. We have used density functional theory calculations to model a structure for these buried nanolines, whose minimum length can be estimated to be 100 nm from the coherence length of the x-ray measurements.

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  • Received 16 August 2005

DOI:https://doi.org/10.1103/PhysRevB.72.121407

©2005 American Physical Society

Authors & Affiliations

Osami Sakata1,*, Wataru Yashiro2,†, D. R. Bowler2,‡, Akiko Kitano1, Kunihiro Sakamoto3, and Kazushi Miki2,§

  • 1Materials Science Division, Japan Synchrotron Radiation Research Institute/SPring-8, Kouto, Mikazuki, Sayo, Hyogo 679-5198, Japan
  • 2International Centre for Young Scientists (ICYS) and Nanomaterials Laboratory (NML), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
  • 3Nanoelectronics Research Institute (NeRI), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan

  • *Electronic address: o-sakata@spring8.or.jp
  • Present address: Department of Advanced Materials Science, Graduate School of Frontier Science, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa-shi, Chiba 277-8561, Japan. Electronic address: yashiro.wataru@nims.go.jp
  • Permanent address: Department of Physics and Astronomy, University College London, Gower St, London WC1E 6BT, U.K. Electronic address: david.bowler@ucl.ac.uk
  • §Electronic address: miki.kazushi@nims.go.jp

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Issue

Vol. 72, Iss. 12 — 15 September 2005

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