Density-functional study of the mechanical and electronic properties of narrow carbon nanotubes under axial stress

F. Bogár, J. W. Mintmire, F. Bartha, T. Mező, and C. Van Alsenoy
Phys. Rev. B 72, 085452 – Published 24 August 2005

Abstract

The behavior of some narrow single-wall carbon nanotubes under uniaxial stress was studied. The first principles local density-functional calculations were carried out using helical repeat units and periodic boundary conditions for a single infinite chain. The mechanical response of the tube, the geometrical deformations, and the axial elastic modulus are calculated. The mechanical deformations are reflected also in the electronic properties. The change of the band gaps of the chiral tubules under axial stress was investigated. The indirect gaps of 0.1eV can be closed applying small (<5%) deformations which results in semiconductor-metal transitions.

  • Figure
  • Figure
  • Figure
  • Received 19 July 2004

DOI:https://doi.org/10.1103/PhysRevB.72.085452

©2005 American Physical Society

Authors & Affiliations

F. Bogár*

  • Protein Chemistry Research Group of the Hungarian Academy of Sciences, University of Szeged, Dóm tér 8., H-6720 Szeged, Hungary

J. W. Mintmire

  • Department of Physics, Oklahoma State University, Stillwater, Oklahoma 74078-3072, USA

F. Bartha and T. Mező

  • Department of Theoretical Physics, University of Szeged, Tisza Lajos krt. 84-86., H-6720 Szeged, Hungary

C. Van Alsenoy

  • Chemistry Department, University of Antwerp, Universiteitsplein 1., B-2610 Wilrijk, Belgium

  • *Electronic address: bogar@sol.cc.u-szeged.hu

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 72, Iss. 8 — 15 August 2005

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×