Noise properties of two single-electron transistors coupled by a nanomechanical resonator

D. A. Rodrigues and A. D. Armour
Phys. Rev. B 72, 085324 – Published 9 August 2005

Abstract

We analyze the noise properties of two single electron transistors (SETs) coupled via a shared voltage gate consisting of a nanomechanical resonator. Working in the regime where the resonator can be treated as a classical system, we find that the SETs act on the resonator like two independent heat baths. The coupling to the resonator generates positive correlations in the currents flowing through each of the SETs as well as between the two currents. In the regime where the dynamics of the resonator is dominated by the back-action of the SETs, these positive correlations can lead to parametrically large enhancements of the low-frequency current noise. These noise properties can be understood in terms of the effects on the SET currents of fluctuations in the state of a resonator in thermal equilibrium that persist for times of the order of the resonator damping time.

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  • Received 14 April 2005

DOI:https://doi.org/10.1103/PhysRevB.72.085324

©2005 American Physical Society

Authors & Affiliations

D. A. Rodrigues and A. D. Armour

  • School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, United Kingdom

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Issue

Vol. 72, Iss. 8 — 15 August 2005

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