Quantitative microscopy of magnetic domains in Fe(100) by core-level x-ray photoelectron spectroscopy

S. Schmidt, N. Weber, H.-J. Elmers, F. Forster, F. Reinert, S. Hüfner, M. Escher, M. Merkel, B. Krömker, and D. Funnemann
Phys. Rev. B 72, 064429 – Published 15 August 2005

Abstract

We present an experimental technique for imaging of magnetic domain patterns based on element-specific core-level photoemission using polarized soft-x-ray radiation. It is applied to the measurement of domain patterns at the Fe(100) surface and at the surface of polycrystalline Fe. Different from well established imaging techniques that use a photoemission electron microscope to measure the secondary electron intensity at the Fe absorption threshold, we have investigated the photoemission intensity contrast on the the Fe 2p32 core level using circularly polarized x-ray light. The linear and circular dichroism characteristics of the identical domain pattern are extracted by linear combinations of the photoemission yield with left and right circular polarization. For the measurement, a newly developed imaging x-ray photoelectron spectroscopy spectrometer “NanoESCA” was used. The method allows, in principle, the determination of all three magnetization components.

    • Received 4 May 2005

    DOI:https://doi.org/10.1103/PhysRevB.72.064429

    ©2005 American Physical Society

    Authors & Affiliations

    S. Schmidt1, N. Weber2, H.-J. Elmers3,*, F. Forster1,†, F. Reinert1,†, S. Hüfner1, M. Escher2, M. Merkel2, B. Krömker4, and D. Funnemann4

    • 1Experimentalphysik FR 7.2, Univerität des Saarlandes, D-66041 Saarbrücken, Germany
    • 2Focus GmbH, 65510 Hünstetten-Görsroth, Germany
    • 3Institut für Physik, Universität Mainz, D-55128 Mainz, Germany
    • 4Omicron Nano Technology GmbH, D-65232 Taunusstein, Germany

    • *Electronic address: elmers@uni-mainz.de
    • Present address: Universität Würzburg, Experimentelle Physik II, D-97074 Würzburg, Germany.

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    Issue

    Vol. 72, Iss. 6 — 1 August 2005

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