Real-space observation of quasicrystalline Sn monolayer formed on the fivefold surface of icosahedral AlCuFe quasicrystal

H. R. Sharma, M. Shimoda, A. R. Ross, T. A. Lograsso, and A. P. Tsai
Phys. Rev. B 72, 045428 – Published 14 July 2005

Abstract

We investigate a thin Sn film grown at elevated temperatures on the fivefold surface of an icosahedral AlCuFe quasicrystal by scanning tunneling microscopy (STM). At about one monolayer coverage, the deposited Sn is found to form a smooth film of height consistent with one-half of the lattice constant of the bulk Sn. Analysis based on the Fourier transform and autocorrelation function derived from high-resolution STM images reveals that Sn grows pseudomorphically and hence exhibits a quasicrystalline structure.

    • Received 16 December 2004

    DOI:https://doi.org/10.1103/PhysRevB.72.045428

    ©2005 American Physical Society

    Authors & Affiliations

    H. R. Sharma1,2,*, M. Shimoda1,2, A. R. Ross3, T. A. Lograsso3, and A. P. Tsai1,2,4

    • 1National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
    • 2Solution-Oriented Research for Science and Technology (SORST), Japan Science and Technology Agency, Kawaguchi, Saitama, 332–0012, Japan
    • 3Department of Materials Science and Engineering, Ames Laboratory, Ames, Iowa 50011, USA
    • 4Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, 980-8577, Japan

    • *Corresponding author. Email address: hemraj.sharma@nims.go.jp

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    Issue

    Vol. 72, Iss. 4 — 15 July 2005

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