Theoretical investigation of electron-phonon interaction in one-dimensional silicon quantum dot array interconnected with silicon oxide layers

Shigeyasu Uno, Nobuya Mori, Kazuo Nakazato, Nobuyoshi Koshida, and Hiroshi Mizuta
Phys. Rev. B 72, 035337 – Published 18 July 2005

Abstract

Electronic and phononic states and their interactions in one-dimensional arrays of Si quantum dots interconnected with thin oxide layers is theoretically investigated. Electronic states under low electric field condition are obtained in the Kronig-Penny potential. Approximate expression for phonon wave functions is developed and numerically calculated using the linear atomic chain model. Simulated dispersion relation shows acoustic phonon modes, phonon band gaps, and confined optical phonon modes. Electron-phonon scattering rate is written using a one-dimensional expression. Intraminiband scattering rates and energy relaxation rates are simulated both for absorption and emission processes. The scattering rate varies from 1012 to 1014, depending on the initial electron energy. The scattering rate for absorption/emission processes rapidly decreases at near the top/bottom of minibands due to limited number of phonon branches that can mediate the scattering processes. Negative energy relaxation rate is observed near the bottom of minibands, which is due to larger scattering rate for absorption process and smaller phonon energy mediating the scatterings for emission process. The scattering rate for absorption decreases rapidly with decreasing temperature. Once the temperature drops down to 100 K, the energy relaxation rate for emission process dominates the absorption process.

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  • Received 3 August 2004

DOI:https://doi.org/10.1103/PhysRevB.72.035337

©2005 American Physical Society

Authors & Affiliations

Shigeyasu Uno*

  • Hitachi Cambridge Laboratory, Hitachi Europe Ltd., Cavendish Laboratory, Madingley Road, Cambridge, CB3 0HE, United Kingdom

Nobuya Mori

  • Department of Electronic Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

Kazuo Nakazato

  • Department of Electrical Engineering and Computer Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan

Nobuyoshi Koshida

  • Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology, Tokyo 184, Japan

Hiroshi Mizuta

  • Department of Physical Electronics, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552, Japan

  • *Electronic address: drsuno@phy.cam.ac.uk; also at CREST JST (Japan Science and Technology), Shibuya TK Bldg., 3-13-11 Shibuya, Shibuya-ku, Tokyo 150-0002, Japan.
  • Also at CREST JST (Japan Science and Technology), Shibuya TK Bldg., 3-13-11 Shibuya, Shibuya-ku, Tokyo 150-0002, Japan.

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Issue

Vol. 72, Iss. 3 — 15 July 2005

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