Effect of disorder in MgB2 thin films

M. Iavarone, R. Di Capua, A. E. Koshelev, W. K. Kwok, F. Chiarella, R. Vaglio, W. N. Kang, E. M. Choi, H. J. Kim, S. I. Lee, A. V. Pogrebnyakov, J. M. Redwing, and X. X. Xi
Phys. Rev. B 71, 214502 – Published 2 June 2005

Abstract

We report on scanning tunneling spectroscopy studies of magnesium diboride (MgB2) thin films grown by different techniques. The films have critical temperatures ranging between 28 and 41 K with very different upper critical fields. We find that the superconducting gap associated with the σ band decreases almost linearly with decreasing critical temperature while the gap associated with the π band is only very weakly affected in the range of critical temperatures above 30 K. In the sample with the lowest critical temperature (28 K) we observe a small increase of the π gap that can only be explained in terms of an increase in the interband scattering. The tunneling data was analyzed in the framework of the two-band model. The magnetic-field-dependent tunneling spectra and the upper critical field measurements of these disordered samples can be consistently explained in terms of an increase of disorder that mostly affects the π band in samples with reduced critical temperatures.

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  • Received 30 July 2004

DOI:https://doi.org/10.1103/PhysRevB.71.214502

©2005 American Physical Society

Authors & Affiliations

M. Iavarone, R. Di Capua*, A. E. Koshelev, and W. K. Kwok

  • Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA

F. Chiarella and R. Vaglio

  • INFM-Coherentia Dipartimento di Scienze Fisiche, Facoltà di Ingegneria, Università di Napoli “Federico II,” P. le Tecchio 80, 80125 Napoli, Italy

W. N. Kang, E. M. Choi, H. J. Kim, and S. I. Lee

  • NCRICS and Department of Physics, Pohang University of Science and Technology, Pohang 790-784, Republic of Korea

A. V. Pogrebnyakov, J. M. Redwing, and X. X. Xi

  • Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802

  • *Present address: INFM-Coherentia Dipartimento di Scienze Fisiche, Facolta di Ingegneria, Universita’ di Napoli “Federico II,” P. le Tecchio 80, 80125 Napoli, Italy

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Vol. 71, Iss. 21 — 1 June 2005

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