Ionization of Al recoiled and sputtered from Al(100)

X. Chen, Z. Sroubek, and J. A. Yarmoff
Phys. Rev. B 71, 245412 – Published 21 June 2005

Abstract

The absolute ionization probability of energetic (>500eV) particles recoiled from Al(100) by 2 and 5keV Xe+ bombardment was measured with time-of-flight spectroscopy. These values were then used to calibrate the energy and angular distributions of low-energy (10600eV) sputtered ions collected with an electrostatic analyzer. The independent-particle model of nonadiabatic surface-atom charge exchange, which is typically used to analyze single scattering events, was applied to the ion fractions of the recoiled and sputtered atoms. The model describes all the experimental data from a few eV to the keV range if a different surface electronic temperature is used for recoiling and sputtering. This suggests that the ionization process depends on the instantaneous surface condition at the time of ion emission.

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  • Received 10 November 2004

DOI:https://doi.org/10.1103/PhysRevB.71.245412

©2005 American Physical Society

Authors & Affiliations

X. Chen1, Z. Sroubek1,2, and J. A. Yarmoff1,*

  • 1Department of Physics, University of California, Riverside, California 92521, USA
  • 2Czech Academy of Sciences, URE, Chaberská 57, Prague 8, Czech Republic

  • *Corresponding author. FAX 951-827-4529; Email address: yarmoff@ucr.edu

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Issue

Vol. 71, Iss. 24 — 15 June 2005

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