Photoreflectance of 0.4nm single-walled carbon nanotubes

C. L. Yang, B. Hou, Irene L. Li, Z. M. Li, Z. K. Tang, J. N. Wang, H. J. Liu, and W. K. Ge
Phys. Rev. B 71, 233404 – Published 23 June 2005

Abstract

The photoreflectance spectra of the 0.4nm diameter single-walled carbon nanotubes (SWNTs) have been measured. The sharp features obtained from the experimental spectra have been identified to be the van Hove singularities associated with tubes of different chiralities, and fitted by the first-order derivatives of both real and imaginary parts of the dielectric functions, such that the band structures of the SWNTs are further clarified.

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  • Received 14 September 2004

DOI:https://doi.org/10.1103/PhysRevB.71.233404

©2005 American Physical Society

Authors & Affiliations

C. L. Yang, B. Hou, Irene L. Li, Z. M. Li, Z. K. Tang, J. N. Wang, H. J. Liu, and W. K. Ge*

  • Department of Physics and Institute of Nano-Science and Technology, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China

  • *Corresponding author. Electronic address: phweikun@ust.hk

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Issue

Vol. 71, Iss. 23 — 15 June 2005

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