Coherent ferroelectric switching by atomic force microscopy

Alexander Yu. Emelyanov
Phys. Rev. B 71, 132102 – Published 25 April 2005

Abstract

A classical energy approach is applied to study polarization reversal induced by voltage-modulated atomic force microscopy in ferroelectric single crystals and thin films. Formations of a reversed domain nucleus, its forward growth in a bulk, and sidewise expansions in a film are described by analyzing the domain energetics under an increasing external bias. It is shown that (i) the nucleation is possible even at low driving voltages, (ii) contact instability is typical for a domain in approaching an electrode, and (iii) different stages of the switching process are delimited on the voltage scale.

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  • Received 19 January 2004

DOI:https://doi.org/10.1103/PhysRevB.71.132102

©2005 American Physical Society

Authors & Affiliations

Alexander Yu. Emelyanov*

  • A. F. Ioffe Physico-Technical Institute, Russian Academy of Sciences, 194021 St. Petersburg, Russia

  • *Electronic address: emel@mail.ioffe.ru

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Issue

Vol. 71, Iss. 13 — 1 April 2005

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