Calculation of x-ray spectra for nanocrystalline materials

P. M. Derlet, S. Van Petegem, and H. Van Swygenhoven
Phys. Rev. B 71, 024114 – Published 26 January 2005

Abstract

The calculation of two-theta x-ray diffraction profiles for multimillion atom computer generated nanocrystalline (nc) Ni systems is presented. Peak profile analysis is performed using a standard Williamson-Hall analysis. The derived mean grain size and root-mean-square inhomogeneous strain quantities are compared to similar quantities obtained by direct structural investigation and visualization of the nc atomic configurations. Debye-Waller factors are also calculated from the theoretical x-ray spectra and compare well with those derived from the phonon properties of the nc system.

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  • Received 15 September 2004

DOI:https://doi.org/10.1103/PhysRevB.71.024114

©2005 American Physical Society

Authors & Affiliations

P. M. Derlet, S. Van Petegem, and H. Van Swygenhoven

  • Paul Scherrer Institute, Villigen, CH-5232, Switzerland

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Issue

Vol. 71, Iss. 2 — 1 January 2005

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