Abstract
The calculation of two-theta x-ray diffraction profiles for multimillion atom computer generated nanocrystalline (nc) systems is presented. Peak profile analysis is performed using a standard Williamson-Hall analysis. The derived mean grain size and root-mean-square inhomogeneous strain quantities are compared to similar quantities obtained by direct structural investigation and visualization of the nc atomic configurations. Debye-Waller factors are also calculated from the theoretical x-ray spectra and compare well with those derived from the phonon properties of the nc system.
1 More- Received 15 September 2004
DOI:https://doi.org/10.1103/PhysRevB.71.024114
©2005 American Physical Society