Magnetoresistive dynamics and noise in low-strain manganite films

Akilan Palanisami, M. B. Weissman, and N. D. Mathur
Phys. Rev. B 71, 014423 – Published 19 January 2005

Abstract

ac magnetoresistance measurements of low-strain epitaxial films of La0.7Ca0.3MnO3 on NdGaO3 substrate show an out-of-phase response which switches sign near the metal-insulator transition, indicating at least two types of slow contributors to the magnetoresistance and suggesting the role of a third phase. These films show noise properties very distinct from films under tensile strain. A narrow peak in the noise found at the transition is non-Gaussian but lacks distinct persistent few-state fluctuators. Such fluctuators only appear some 10K below the transition, indicating that conduction in the nominally metallic phase remains highly inhomogeneous. Comparison of discrete fluctuator sizes in a range of materials indicates that strain constraints limit the sizes in films.

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  • Received 3 June 2004

DOI:https://doi.org/10.1103/PhysRevB.71.014423

©2005 American Physical Society

Authors & Affiliations

Akilan Palanisami1, M. B. Weissman1, and N. D. Mathur2

  • 1University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801-3080, USA
  • 2Department of Materials Science, University of Cambridge, Cambridge CB2 3QZ, United Kingdom

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Vol. 71, Iss. 1 — 1 January 2005

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