Interference effects in the conductance of multilevel quantum dots

C. A. Büsser, G. B. Martins, K. A. Al-Hassanieh, Adriana Moreo, and Elbio Dagotto
Phys. Rev. B 70, 245303 – Published 2 December 2004

Abstract

Using exact-diagonalization techniques supplemented by a Dyson equation embedding procedure, the transport properties of multilevel quantum dots are investigated in the Kondo regime. The conductance can be decomposed into the contributions of each level. It is shown that these channels can carry a different phase, and destructive interference processes are observed when the phase difference between them is ±π. This effect is very different from those observed in bulk metals with magnetic impurities, where the phase differences play no significant role. The effect is also different from other recent studies of interference processes in dots, as discussed in the text. In particular, no external magnetic field is introduced here, and the dot-leads hopping amplitude for all levels are the same. However, conductance cancellations induced by interactions are still observed. Another interesting effect reported here is the formation of localized states that do not participate in the transport. When one of these states crosses the Fermi level, the electronic occupation of the quantum dot changes, modifying the many-body physics of the system and indirectly affecting the transport properties. Unusual discontinuities between two finite conductance values can occur as the gate voltage is varied, as discussed here.

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  • Received 16 April 2004

DOI:https://doi.org/10.1103/PhysRevB.70.245303

©2004 American Physical Society

Authors & Affiliations

C. A. Büsser*, G. B. Martins, K. A. Al-Hassanieh, Adriana Moreo*, and Elbio Dagotto*

  • National High Magnetic Field Lab and Department of Physics, Florida State University, Tallahassee, Florida 32306, USA

  • *Present address: Department of Physics, University of Tennessee, Knoxville, TN 37996.
  • Present address: Department of Physics, Oakland University, Rochester, MI 48309.

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Issue

Vol. 70, Iss. 24 — 15 December 2004

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