Shot noise in tunneling through a single quantum dot

A. Nauen, F. Hohls, N. Maire, K. Pierz, and R. J. Haug
Phys. Rev. B 70, 033305 – Published 13 July 2004

Abstract

We investigate the noise properties of a zero-dimensional InAs quantum dot (QD) embedded in a GaAs‐AlAs‐GaAs tunneling structure. We observe an approximately linear dependence of the Fano factor and the current as a function of bias voltage. Both effects can be linked to the scanning of the three-dimensional emitter density of states by the QD. At the current step the shape of the Fano factor is mainly determined by the Fermi function of the emitter electrons. The observed voltage and temperature dependence is compared to the results of a master equation approach.

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  • Received 3 March 2004

DOI:https://doi.org/10.1103/PhysRevB.70.033305

©2004 American Physical Society

Authors & Affiliations

A. Nauen1,2, F. Hohls1,*, N. Maire1, K. Pierz3, and R. J. Haug1

  • 1Institut für Festkörperphysik, Universität Hannover, Appelstrasse 2, D‐30167 Hannover, Germany
  • 2Division of Solid State Physics, Lund University, P.O. Box 118, SE‐221 00 Lund, Sweden
  • 3Physikalisch-Technische Bundesanstalt, Bundesallee 100, D‐38116 Braunschweig, Germany

  • *Electronic address: hohls@nano.uni-hannover.de

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Vol. 70, Iss. 3 — 15 July 2004

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