Spectroscopy of the electronic states in InAs quantum dots grown on InxAl1xAs/InP(001)

F. Fossard, A. Helman, G. Fishman, F. H. Julien, J. Brault, M. Gendry, E. Péronne, A. Alexandrou, S. E. Schacham, G. Bahir, and E. Finkman
Phys. Rev. B 69, 155333 – Published 29 April 2004
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Abstract

We have investigated optical properties of high-density InAs self-assembled quantum dots (QDs) in an InxAl1xAs matrix, lattice matched to an InP (001) substrate. The weak lattice mismatch (3%) results in a 90% coverage of the InxAl1xAs surface with InAs QDs. By means of interband and intraband spectroscopies crossed with atomic force microscopy (AFM) measurements, we have determined that the InAs QDs optical properties depend on the deposited amount of InAs. Photoinduced absorption spectroscopy has been used to investigate midinfrared intraband absorptions. For three monolayers (ML) InAs deposit thickness, just above two-dimensional (2D)/3D growth mode transition (2.5 ML), the islands form as isolated elliptical dots elongated along the [11¯0] direction and exhibit intraband resonances polarized either along the [110] or the [11¯0] direction. For thicker deposition (>3ML), InAs islands form chains of elliptical dots along the [11¯0] direction where the quantum confinement is lost, resulting in a quantum-wire-like behavior. In this paper, we also report on photoluminescence and photocurrent spectroscopies, in order to get insight into the InAs/InxAl1xAs island band structure. These experimental results are in good agreement with that of a multiband kp model.

  • Received 13 May 2003

DOI:https://doi.org/10.1103/PhysRevB.69.155333

©2004 American Physical Society

Authors & Affiliations

F. Fossard*, A. Helman, G. Fishman, and F. H. Julien

  • Institut d’Electronique Fondamentale, UMR 8622 CNRS, Université Paris XI, 91405 Orsay Cedex, France

J. Brault and M. Gendry

  • Laboratoire d’Electronique-LEOM, UMR 5512 CNRS, Ecole Centrale de Lyon, 69134 Ecully Cedex, France

E. Péronne and A. Alexandrou

  • Laboratoire d’Optique et Bioscience, UMR 7645 CNRS, Ecole Polytechnique-Ensta, 91128 Palaiseau Cedex, France

S. E. Schacham

  • Department of Electrical and Electronical Engineering, College of Judea and Samaria, Ariel 44837, Israel

G. Bahir and E. Finkman

  • Department of Electrical Engineering and Solid State Institute, Technion, Haifa 32000, Israel

  • *Corresponding author. Electronic address: frederic.fossard@ ief.u-psud.fr

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Vol. 69, Iss. 15 — 15 April 2004

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