Accurate band mapping via photoemission from thin films

A. Mugarza, A. Marini, T. Strasser, W. Schattke, A. Rubio, F. J. García de Abajo, J. Lobo, E. G. Michel, J. Kuntze, and J. E. Ortega
Phys. Rev. B 69, 115422 – Published 22 March 2004
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Abstract

Electron bands in solids can be determined in angle-resolved photoemission experiments from thin films, where the perpendicular wave vector (k) uncertainty that characterizes photoemission from bulk crystals is removed. However, the comparison with state-of-the-art quasiparticle band-structure calculations has never been done. In this work we have mapped both initial-state (occupied) and final-state (empty) E(k) bands along the Λ axis of aluminum, from photon-energy- and thickness-dependent quantum-well spectra of aluminum films. For final states the best fit is obtained with inverse low-energy electron diffraction band structure calculations. For initial-state bands of Cu and Al, thin-film data display excellent agreement with bulk quasiparticle theory, suggesting the use of thin films as model systems to investigate fine effects in the crystal band structure.

  • Received 23 July 2003

DOI:https://doi.org/10.1103/PhysRevB.69.115422

©2004 American Physical Society

Authors & Affiliations

A. Mugarza1,2, A. Marini2, T. Strasser3, W. Schattke3, A. Rubio2,4, F. J. García de Abajo2, J. Lobo5, E. G. Michel5, J. Kuntze2, and J. E. Ortega1,2

  • 1Departamento de Física Aplicada I, Universidad del País Vasco, Plaza Oñate 2, E-20018 San Sebastián, Spain
  • 2Centro Mixto CSIC/UPV and DIPC, 20018 San Sebastián, Spain
  • 3Institut für Theoretische Physik und Astrophysik, Christian-Albrechts-Universität zu Kiel, Leibnizstrasse 15, D-24098 Kiel, Germany
  • 4Departamento de Física de Materiales, Universidad del País Vasco, E-20018 San Sebastián, Spain
  • 5Departamento de Física de la Materia Condensada and Instituto Nicolás Cabrera, U. Autónoma de Madrid, 28049 Madrid, Spain

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Issue

Vol. 69, Iss. 11 — 15 March 2004

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