Local disorder and optical properties in V-shaped quantum wires: Toward one-dimensional exciton systems

T. Guillet, R. Grousson, V. Voliotis, X. L. Wang, and M. Ogura
Phys. Rev. B 68, 045319 – Published 30 July 2003
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Abstract

The exciton localization is studied in GaAs/GaAlAs V-shaped quantum wires (QWR’s) by high spatial resolution spectroscopy. Scanning optical imaging of different generations of samples shows that the localization length has been enhanced as the growth techniques were improved. In the best samples, excitons are delocalized in islands of length of the order of 1μm, and form a continuum of one-dimensional states in each of them, as evidenced by the T dependence of the radiative lifetime. On the opposite, in the previous generation of QWR’s, the localization length is typically 50 nm and the QWR behaves as a collection of quantum boxes. These localization properties are compared to structural properties and related to the progresses of the growth techniques. The presence of residual disorder is evidenced in the best samples and explained by the separation of electrons and holes due to the large built-in piezoelectric field present in the structure.

  • Received 11 November 2002

DOI:https://doi.org/10.1103/PhysRevB.68.045319

©2003 American Physical Society

Authors & Affiliations

T. Guillet*, R. Grousson, and V. Voliotis

  • Groupe de Physique des Solides, CNRS, Universités Pierre et Marie Curie et Denis Diderot, 2 place Jussieu, F-75251 Paris Cedex 05, France

X. L. Wang and M. Ogura

  • Photonics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, Tsukuba 305-8568, Japan
  • CREST, Japan Science and Technology Corporation (JST), 4-1-8 Honcho, Kawaguchi 332-0012, Japan

  • *Also at Département de Physique, Ecole Polytechnique Fédérale de Lausanne, Switzerland; electronic address: guillet@gps.jussieu.fr
  • Also at Université Evry-Val d’Essonne, France.
  • Also at Department of Electrical Engineering, Yale University, New Haven, CT.

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Vol. 68, Iss. 4 — 15 July 2003

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