Few-particle interactions in charged InxGa1xAs/GaAs quantum dots

F. Guffarth, R. Heitz, A. Schliwa, O. Stier, M. Geller, C. M. A. Kapteyn, R. Sellin, and D. Bimberg
Phys. Rev. B 67, 235304 – Published 9 June 2003
PDFExport Citation

Abstract

The impact of few-particle interactions on excited states of excitons localized in self-organized InxGa1xAs/GaAs quantum dots (QD’s), charged either with electrons or holes, is investigated. Excited-state absorption is probed size selectively by photoluminescence excitation spectroscopy improving the achieved resolution beyond the inhomogeneous broadening. Charging QD’s embedded in suitable diode structures leads to nonlinear changes of the absorption characteristics for the individual excited-state transitions, enabling their unambiguous identification. Few-particle interactions lead to a renormalization of the excited-state transition energies, which ranges from a pronounced red shift to a blue shift depending on the excited-state transition and the type of spectator charge. The most pronounced effects occur charging the ground state of the QD’s. The results are supported by eight-band kp model calculations using a configuration-interaction scheme to account for the Coulomb interaction in the few-particle states.

  • Received 26 July 2002

DOI:https://doi.org/10.1103/PhysRevB.67.235304

©2003 American Physical Society

Authors & Affiliations

F. Guffarth*, R. Heitz, A. Schliwa, O. Stier, M. Geller, C. M. A. Kapteyn, R. Sellin, and D. Bimberg

  • Institut für Festkörperphysik, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany

  • *Electronic address: florian@sol.physik.tu-berlin.de

References (Subscription Required)

Click to Expand
Issue

Vol. 67, Iss. 23 — 15 June 2003

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×