Adsorption and manipulation of endohedral and higher fullerenes on Si(100)2×1

M. J. Butcher, J. W. Nolan, M. R. C. Hunt, P. H. Beton, L. Dunsch, P. Kuran, P. Georgi, and T. J. S. Dennis
Phys. Rev. B 67, 125413 – Published 19 March 2003
PDFExport Citation

Abstract

The adsorption of the endohedral fullerene, La@C82, and the higher fullerene, C84, on Si(100)2×1 is investigated using a scanning tunneling microscope (STM) operating in ultrahigh vacuum. Both molecules are found to adsorb directly above the dimer rows that are formed on the Si(100)2×1 surface, as well as in trough sites midway between dimer rows. Adsorption above dimer rows, not observed for C60, is attributed to the larger radius of curvature of these fullerene cages. The response of La@C82 to manipulation by the tip of the STM is also investigated. Molecules in either adsorption site may be manipulated with a threshold gap impedance ∼1.0 GΩ. Owing to a near-commensurability between the molecular diameter of La@C82 and the lattice constant of the Si(100) surface, close-packed arrangements of molecules may be formed.

  • Received 21 March 2002

DOI:https://doi.org/10.1103/PhysRevB.67.125413

©2003 American Physical Society

Authors & Affiliations

M. J. Butcher, J. W. Nolan, M. R. C. Hunt, and P. H. Beton

  • School of Physics and Astronomy, University of Nottingham, Nottingham, NG7 2RD, United Kingdom

L. Dunsch, P. Kuran, and P. Georgi

  • Leibniz-Institut für Festkörper- und Werkstrofforschung Dresden, Group of Electrochemistry and Conducting Polymers, D-01171 Dresden, Germany

T. J. S. Dennis

  • Department of Chemistry, Queen Mary and Westfield College, University of London, London E1 4NS, United Kingdom

References (Subscription Required)

Click to Expand
Issue

Vol. 67, Iss. 12 — 15 March 2003

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×