Abstract
It is shown that the spin-polarized electronic structure of antiferromagnetic (AFM) materials can be investigated on an element-selective level using a versatile, novel x-ray magneto-optical spectroscopy in reflection. We demonstrate this with spectra observed at the Ni absorption edge of two buried exchange-biased microstructures of current technological interest: NiO/Co and NiMn/Co, which contain the insulating antiferromagnet NiO, and the metallic antiferromagnet NiMn, respectively. The measured spectrum provides information about the exchange-split d density of states of the AFM atom.
- Received 7 November 2002
DOI:https://doi.org/10.1103/PhysRevB.67.052401
©2003 American Physical Society
