Single photoelectron trapping, storage, and detection in a field effect transistor

Hideo Kosaka, Deepak S. Rao, Hans D. Robinson, Prabhakar Bandaru, Kikuo Makita, and Eli Yablonovitch
Phys. Rev. B 67, 045104 – Published 17 January 2003
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Abstract

We have demonstrated that a single photoelectron can be trapped, stored, and its photoelectric charge detected by a source/drain channel in a transistor. The electron trap can be photoionized and repeatedly reset for the arrival of successive individual photons. This single-photoelectron transistor, operating in the λ=1.3μm telecommunication band, was demonstrated by using a window-gate double-quantum-well InGaAs/InAlAs/InP heterostructure that was designed to provide near-zero electron g factor. In general, g-factor engineering allows selection rules that would convert a photon polarization to an electron-spin polarization. Such a transistor photodetector could be useful for flagging the safe arrival of a photon in a quantum repeater. In the future, the safe arrival of a photoelectric charge would trigger the commencement of the teleportation algorithm in a quantum repeater to be used for quantum telecommunications.

  • Received 29 August 2002

DOI:https://doi.org/10.1103/PhysRevB.67.045104

©2003 American Physical Society

Authors & Affiliations

Hideo Kosaka1,*, Deepak S. Rao1, Hans D. Robinson1, Prabhakar Bandaru1, Kikuo Makita2, and Eli Yablonovitch1

  • 1Electrical Engineering Department, University of California at Los Angeles, Los Angeles, California 90095-1594
  • 2Photonics and Wireless Device Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, Ibaraki 305-8501, Japan

  • *On leave from Fundamental Research Laboratories, NEC Corporation.

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Vol. 67, Iss. 4 — 15 January 2003

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