Abstract
A model was proposed to account for a different kind of history effect in the transport measurement of a sample with inhomogeneous flux pinning coupled with flux creep. The inhomogeneity of flux pinning was described in terms of alternating weak pinning (lower and strong pinning regions (higher The flux creep was characterized by logarithmic barrier. Based on this model, we numerically observed the same clockwise loops as reported in references. Moreover, we predicted behaviors of the loop at different sweeping rates of applied current and magnetic fields etc. Electric transport measurement was performed in Ag-sheathed tapes immersed in liquid nitrogen with and without magnetic fields. A loop at certain and was observed. It is found that the area of the loop is more sensitive to than to which agrees well with our numerical results.
- Received 19 September 2001
DOI:https://doi.org/10.1103/PhysRevB.66.144510
©2002 American Physical Society