Phys. Rev. B 66, 035310 (2002) - Strain in buried quantum wires: Analytical calculations and x-ray diffraction study

Strain in buried quantum wires: Analytical calculations and x-ray diffraction study

V. M. Kaganer, B. Jenichen, G. Paris, K. H. Ploog, O. Konovalov, P. Mikulík, and S. Arai

Phys. Rev. B 66, 035310 – Published 9 July 2002

Abstract

The displacement field in and around periodically arranged quantum wires embedded in a crystalline matrix is calculated analytically for an arbitrary finite thickness of the cover layer. A good agreement is obtained between measured x-ray-diffraction peaks of a wire structure and kinematical calculations with the displacement field derived in the paper. The strain and quantum size effects on the photoluminescence line shift are found to be comparable, due to small width (35 nm) of the wires.

Received 22 November 2001

DOI:https://doi.org/10.1103/PhysRevB.66.035310

©2002 American Physical Society

Authors & Affiliations

V. M. Kaganer, B. Jenichen, G. Paris, and K. H. Ploog

Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, D-10117 Berlin, Germany

European Synchrotron Radiation Facility, BP220, Grenoble, France

Fraunhofer Institut für Zerstörungsfreie Prüfverfahren, EADQ, Krügerstr. 22, D-01326 Dresden, Germany

Research Center for Quantum Effect Electronics, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552, Japan

^*On leave from the Laboratory of Thin Films and Nanostructures, Masaryk University, Kotlářská 2, Brno, Czech Republic.

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Issue

Vol. 66, Iss. 3 — 15 July 2002

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