Investigations of single-wall carbon nanotube growth by time-restricted laser vaporization

Alex A. Puretzky, Henrik Schittenhelm, Xudong Fan, Michael J. Lance, Larry F. Allard, Jr., and David B. Geohegan
Phys. Rev. B 65, 245425 – Published 24 June 2002
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Abstract

The growth times of single-wall carbon nanotubes (SWNT’s) within a high-temperature laser-vaporization (LV) reactor were measured and adjusted through in situ imaging of the plume of laser-ablated material using Rayleigh-scattered light induced by time-delayed, 308-nm laser pulses. Short SWNT’s were synthesized by restricting the growth time to less than 20 ms for ambient growth temperatures of 760–1100 °C. Statistical analysis of transmission electron microscope photographs indicated most-probable lengths of 35–77 nm for these conditions. Raman spectra (Eex=1.96 and 2.41 eV) of the short nanotubes indicate that they are well-formed SWNT’s. The temperature of the particles in the vortex-ring-shaped plume during its thermalization to the oven temperature was estimated by collecting its blackbody emission spectra at different spatial positions inside the oven and fitting them to Planck’s law. These data, along with detailed oven temperature profiles, were used to deduce a complete picture of the time spent by the plume at high growth temperatures (760–1100 °C). The upper and lower limits of the growth rates of SWNT’s were estimated as 0.6 and 5.1 μm/s for the typical nanosecond Nd:YAG laser-vaporization conditions used in this study. These measurements permit the completion of a general picture of SWNT growth by LV based on imaging, spectroscopy, and pyrometry of ejected material at different times after ablation, which confirms our previous measurements that the majority of SWNT growth occurs at times greater than 20 ms after LV by the conversion of condensed phase carbon.

  • Received 1 February 2002

DOI:https://doi.org/10.1103/PhysRevB.65.245425

©2002 American Physical Society

Authors & Affiliations

Alex A. Puretzky1,2, Henrik Schittenhelm1, Xudong Fan1,*, Michael J. Lance1, Larry F. Allard, Jr.1, and David B. Geohegan1

  • 1Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056
  • 2Department of Materials Science and Engineering, University of Tennessee, Knoxville, Tennessee 37996-22100

  • *Present address: Center for Advanced Microscopy, Michigan State University, East Lansing, Michigan 48824.

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Issue

Vol. 65, Iss. 24 — 15 June 2002

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