Charge-transfer excitations in lanthanum compounds measured by resonant inelastic x-ray scattering at the M5 edge

C. Dallera, K. Giarda, G. Ghiringhelli, A. Tagliaferri, L. Braicovich, and N. B. Brookes
Phys. Rev. B 64, 153104 – Published 20 September 2001
PDFExport Citation

Abstract

We present resonant inelastic x-ray scattering spectra from La metal La2CuO4 and LaF3. Monochromatic photon excitation with energy across the La 3d5/2 (M5) threshold was used and the valence scattering was monitored at selected incoming energies. The spectra vs the outgoing photon energy show the elastic peak, the 5p3d5/2 decay peak and, in between, a feature due to charge transfer excitation. This brings an electron from the ligand to the lanthanum 4f states (in the case of La2CuO4 and LaF3) and results from a charge fluctuation from 4f0 to 4f1 occupation in the case of La metal. The energy transferred to the solid when this process occurs is remarkably different in the three cases and correlates with the difference in the electronegativity with the lanthanum neighbors. The present approach allows us to reveal features that are completely hidden in the x-ray absorption spectra.

  • Received 3 May 2001

DOI:https://doi.org/10.1103/PhysRevB.64.153104

©2001 American Physical Society

Authors & Affiliations

C. Dallera1,*, K. Giarda1, G. Ghiringhelli1, A. Tagliaferri2, L. Braicovich1, and N. B. Brookes2

  • 1INFM - Dipartimento di Fisica, Politecnico di Milano, piazza Leonardo da Vinci 32, 20133 Milano, Italy
  • 2European Synchrotron Radiation Facility, B. P. 220, F-38043 Grenoble Cédex, France

  • *Electronic address: claudia.dallera@fisi.polimi.it

References (Subscription Required)

Click to Expand
Issue

Vol. 64, Iss. 15 — 15 October 2001

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×