Mesoscopic-capacitor effect in GaN/AlxGa1xN quantum wells: Effects on the electronic states

A. Di Carlo, A. Reale, P. Lugli, G. Traetta, M. Lomascolo, A. Passaseo, R. Cingolani, A. Bonfiglio, M. Berti, E. Napolitani, M. Natali, S. K. Sinha, A. V. Drigo, A. Vinattieri, and M. Colocci
Phys. Rev. B 63, 235305 – Published 17 May 2001
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Abstract

We show that wide GaN quantum wells behave like mesoscopic capacitors. The electron-hole pairs are separated by the spontaneous and piezoelectric polarization fields and accumulated in the well, resulting in a well-width dependent screening of the built-in field. The extent to which such screening is effective depends on the interplay between radiative and nonradiative recombination probabilities, which deplete the ground level of the quantum well, causing the recovery of the unscreened built-in field. The account of the mesoscopic capacitor effect provides a quantitative description of the optical spectra and of the time dynamics of a set of high quality quantum wells with well characterized structural parameters.

  • Received 1 December 2000

DOI:https://doi.org/10.1103/PhysRevB.63.235305

©2001 American Physical Society

Authors & Affiliations

A. Di Carlo, A. Reale, and P. Lugli

  • INFM, Department of Electronic Engineering, University of Rome “Tor Vergata,” Rome, Italy

G. Traetta, M. Lomascolo*, A. Passaseo, and R. Cingolani

  • INFM, Department of Innovation Engineering, University of Lecce, Via Arnesano, I-73100, Lecce, Italy

A. Bonfiglio

  • INFM, Electric and Electronic Engineering Department, University of Cagliari, Cagliari, Italy

M. Berti, E. Napolitani, M. Natali, S. K. Sinha, and A. V. Drigo

  • INFM, Department of Physics, University of Padova, Via Marzolo 8, I-35131 Padova, Italy

A. Vinattieri and M. Colocci

  • INFM, Department of Physics and LENS, Largo E. Fermi 2, I-50125 Firenze, Italy

  • *Permanent address: Istituto per lo studio dei nuovi materiali per l’elettronica IME-CNR, Campus Universitario, Via per Arnesano, 73100, Lecce (Italy).

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Issue

Vol. 63, Iss. 23 — 15 June 2001

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