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Electron-hole plasma emission from In0.3Ga0.7N/GaN multiple quantum wells

M. Hao, S. J. Chua, X. H. Zhang, W. Wang, E. K. Sia, L. S. Wang, A. Raman, P. Li, and W. Liu
Phys. Rev. B 63, 121308(R) – Published 7 March 2001
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Abstract

In0.3Ga0.7N/GaN multiple quantum wells have been grown on the epitaxial lateral overgrowth GaN successfully. The samples have been characterized by transmission electron microscopy and x-ray diffraction, which show the high quality of the samples. Photoluminescence measurements have been carried out at room temperature, with back scattering geometry. At a low excitation power, only exciton-related emission has been observed at 3.1935 eV. With increasing excitation power, a peak appears at the low-energy side of the exciton-related emission, and becomes dominant at high excitation power. This peak has been assigned to plasma emission, because the intensity of this peak increases with excitation power as Iex1.9.

  • Received 21 November 2000

DOI:https://doi.org/10.1103/PhysRevB.63.121308

©2001 American Physical Society

Authors & Affiliations

M. Hao, S. J. Chua, X. H. Zhang, W. Wang, E. K. Sia, L. S. Wang, and A. Raman

  • Institute of Materials Research and Engineering, 3 Research Link, 117602 Singapore

P. Li and W. Liu

  • Center for Optoelectronics, Department of Electrical Engineering, National University of Singapore, 119260 Singapore

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Issue

Vol. 63, Iss. 12 — 15 March 2001

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