Vortex dynamics in amorphous MoxSi1x films detected by voltage noise

S. Okuma and N. Kokubo
Phys. Rev. B 61, 671 – Published 1 January 2000
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Abstract

We have measured the current-induced voltage noise SV for both the thick and thin films of amorphous MoxSi1x with strong pinning, over a broad frequency range, to study the effects of both the current I and magnetic field B on the vortex dynamics. The results show that the vortex dynamics probed by SV strikingly depends on the static vortex states. Irrespective of the film thickness, noise is largest at B0, while small vortex shot noise is observed at high B in the vortex-liquid phase. The origin of large noise at B0 is due mainly to density fluctuations of the thermally excited and subsequently grown vortex loops and dissociated vortex-antivortex pairs for three dimensions (3D) and 2D, respectively, in the presence of an applied current. In the three-dimensional vortex-solid phase, the 1/fβ(β<0.6)-like noise spectra resulting from a plastic-flow motion of vortices are observed at low I over the broad field region, which is attributed to high concentration of pinning centers. With increasing I in the nonlinear regime, both the amplitude and spectral exponent β of SV decrease and eventually approach the values in the vortex-liquid phase.

  • Received 26 October 1998

DOI:https://doi.org/10.1103/PhysRevB.61.671

©2000 American Physical Society

Authors & Affiliations

S. Okuma and N. Kokubo

  • Research Center for Very Low Temperature System, Tokyo Institute of Technology, 2-12-1, Ohokayama, Meguro-ku, Tokyo 152-8551, Japan

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Vol. 61, Iss. 1 — 1 January 2000

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