Reflectance-based optically detected resonance studies of neutral and negatively charged donors in GaAs/AlxGa1xAs quantum wells

G. Kioseoglou, H. D. Cheong, T. Yeo, H. A. Nickel, A. Petrou, B. D. McCombe, A. Yu. Sivachenko, A. B. Dzyubenko, and W. Schaff
Phys. Rev. B 61, 5556 – Published 15 February 2000
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Abstract

We report a reflectance-based optically detected resonance (ODR) study of neutral and negatively charged donors in GaAs/AlxGa1xAs quantum-well structures. The intensity of the e1h1(1s) excitonic reflectance feature was modulated by resonant absorption of a monochromatic far-infrared (FIR) laser beam. An externally applied magnetic field was used to bring the internal transitions among various impurity states in resonance with the FIR photon energy. Predicted, but not previously reported, internal transitions of negatively charged donors were observed and were found to be in good agreement with theoretical calculations. This study establishes that the reflectance-based ODR technique is a sensitive tool for the investigation of donor states (both neutral and negatively charged) in semiconductor quantum wells.

  • Received 1 October 1999

DOI:https://doi.org/10.1103/PhysRevB.61.5556

©2000 American Physical Society

Authors & Affiliations

G. Kioseoglou, H. D. Cheong, T. Yeo, H. A. Nickel, A. Petrou, and B. D. McCombe

  • Department of Physics and Center for Advanced Photonic and Electronic Materials, State University of New York at Buffalo, Buffalo, New York 14260

A. Yu. Sivachenko

  • The Weizmann Institute of Science, Rehovot 76100, Israel

A. B. Dzyubenko*

  • General Physics Institute, RAS, Moscow 117942, Russia

W. Schaff

  • Cornell University, Ithaca, New York, 14853

  • *Present address: Institut für Theoretische Physik, J. W. Goethe-Universität, 60054 Frankfurt, Germany.

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Vol. 61, Iss. 8 — 15 February 2000

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