Abstract
The application of the usual expressions to calculate the capacitance-voltage (CV) profiles in samples with quantum dots gives erroneous results, mainly due to the presence of the characteristic negative differential capacitance of a system with dimensionality lower than 2. We developed a simple electrostatic model to calculate the CV profiles in these systems, and we applied it to a sample with an InAs self-assembled quantum dots system in order to obtain informations about the structure of the dots. As a result, the local distribution of electrons in the quantum dots (CV profile) was obtained.
- Received 27 April 1999
DOI:https://doi.org/10.1103/PhysRevB.61.5499
©2000 American Physical Society