Structure of an InAs(111)A(2×2)S surface studied by scanning tunneling microscopy, photoelectron spectroscopy, and x-ray photoelectron diffraction

S. Ichikawa, N Sanada, S. Mochizuki, Y. Esaki, Y. Fukuda, M. Shimomura, T. Abukawa, and S. Kono
Phys. Rev. B 61, 12982 – Published 15 May 2000
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Abstract

The structure of an InAs(111)A(2×2)S surface has been studied by using scanning tunneling microscopy (STM), synchrotron radiation photoemission spectroscopy (SRPES), and x-ray photoelectron diffraction (XPD). Honeycomblike images are observed by STM measured at a bias voltage of -1.4 V. Similar images are also observed at +1.5 V, although the intensity of the alternative corner of a hexagon is depressed, resulting in a threefold symmetry. S2s and As3d XPD patterns show that sulfur atoms rarely exchange the fourfold arsenic sites. Three surface components are found in the In4d spectra. On the other hand, no surface components are found in the As3d spectra. Based on the STM, SRPES, and XPD results, a probable structure model for the (2×2)S surface is proposed. The experimental XPD patterns are in good agreement with the calculated ones.

  • Received 4 June 1999

DOI:https://doi.org/10.1103/PhysRevB.61.12982

©2000 American Physical Society

Authors & Affiliations

S. Ichikawa*, N Sanada, S. Mochizuki, Y. Esaki, and Y. Fukuda

  • Research Institute of Electronics, Shizuoka University, Hamamatsu 432-8011, Japan

M. Shimomura, T. Abukawa, and S. Kono

  • Research Institute for Scientific Measurements, Tohoku University, Sendai 980-8577, Japan

  • *Present address: Kokan Keisoku K. K. Minami Watarida 1-1, Kawasaki-ku, Kawasaki, 210-0855 Japan.
  • Author to whom correspondence should be addressed. Electronic mail: royfuku@ipc.shizuoka.ac.jp

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Vol. 61, Iss. 19 — 15 May 2000

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