Microwave resonance and weak pinning in two-dimensional hole systems at high magnetic fields

C.-C. Li, J. Yoon, L. W. Engel, D. Shahar, D. C. Tsui, and M. Shayegan
Phys. Rev. B 61, 10905 – Published 15 April 2000
PDFExport Citation

Abstract

Microwave frequency conductivity Re(σxx) of high quality two-dimensional hole systems (2DHS) in a large perpendicular magnetic field (B) is measured with the carrier density (ns) of the 2DHS controlled by a backgate bias. The high-B insulating phase of the 2DHS exhibits a microwave resonance that remains well defined, but shifts to higher peak frequency (fpk) as ns is reduced. In different regimes, fpk vs ns can be fit to fpkns1/2 or to fpkns3/2. The data clearly indicate that both carrier-carrier interactions and disorder are indispensable in determining the dynamics of the insulator. The ns dependence of fpk is consistent with a weakly pinned Wigner crystal in which domain size increases with ns, due to larger carrier-carrier interaction.

  • Received 15 November 1999

DOI:https://doi.org/10.1103/PhysRevB.61.10905

©2000 American Physical Society

Authors & Affiliations

C.-C. Li and J. Yoon

  • Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544

L. W. Engel

  • National High Magnetic Field Laboratory, Florida State University, Tallahassee, Florida 32306

D. Shahar

  • Department of Condensed Matter Physics, Weizmann Institute, Rehovot 76100, Israel

D. C. Tsui and M. Shayegan

  • Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544

References (Subscription Required)

Click to Expand
Issue

Vol. 61, Iss. 16 — 15 April 2000

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×