Reinterpretation of the scanning tunneling microscopy images of Si(100)(2×1) dimers

Kenji Hata, Satoshi Yasuda, and Hidemi Shigekawa
Phys. Rev. B 60, 8164 – Published 15 September 1999
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Abstract

We revisit and refine the interpretation of the scanning tunneling microscopy (STM) images of the Si(100) dimers, based on results from an extensive set of STM observations carried out at low temperature (80 K) and total-energy calculations of Si(100) surfaces. The interpretation addresses some unresolved questions and brings much experimental and theoretical research into unanimous agreement. We show that tunneling from surface resonances and bulk states seriously contributes to the STM images within usual tunneling conditions. In the empty state, tunneling from these states overwhelms tunneling from the localized π* surface state, which STM is generally believed to observe.

  • Received 4 May 1998

DOI:https://doi.org/10.1103/PhysRevB.60.8164

©1999 American Physical Society

Authors & Affiliations

Kenji Hata*, Satoshi Yasuda, and Hidemi Shigekawa*

  • Institute of Applied Physics and CREST, Japan Science and Technology Corporation (JST), University of Tsukuba, Tennodai 1-1-1, Tsukuba 305-8573, Japan

  • *Electronic address: hata@ims.tsukuba.ac.jp, hidemi@ims.tsukuba.ac.jp World Wide Web: http://dora.ims.tsukuba.ac.jp

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Issue

Vol. 60, Iss. 11 — 15 September 1999

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