Adsorption and growth of Xe adlayers on the Cu(111) surface

Ji-Yong Park, S.-J. Kahng, U. D. Ham, Y. Kuk, K. Miyake, K. Hata, and H. Shigekawa
Phys. Rev. B 60, 16934 – Published 15 December 1999
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Abstract

The adsorption and growth of Xe layers on the Cu(111) surface were studied with a low-temperature scanning tunneling microscope. Initially, Xe atoms preferentially adsorb at the step, revealing two different wetting behaviors at the upper and the lower step edges at the coverage of <0.1 monolayer. Three-dimensional island growth is followed on the terrace at the coverage of >0.2 monolayer when grown at <20 K. The island growth is attributed to inhomogeneous nucleation and lower diffusivity of Xe on the Xe monolayer than on the Cu(111) surface. The diffusion barriers, the two-dimensional barrier on a terrace and the one-dimensional barrier along a step, and the step-down barrier determine the growth morphology of Xe layers as the substrate temperature was raised.

  • Received 24 May 1999

DOI:https://doi.org/10.1103/PhysRevB.60.16934

©1999 American Physical Society

Authors & Affiliations

Ji-Yong Park, S.-J. Kahng, U. D. Ham, and Y. Kuk*

  • Department of Physics and Center for Science in Nanometer Scale, Seoul National University, Seoul 151-742, Korea

K. Miyake and K. Hata

  • Institute of Applied Physics and CREST, Japan Science and Technology Corporation (JST), University of Tsukuba, Tsukuba 305-8573, Japan

H. Shigekawa

  • Institute of Applied Physics and CREST, Japan Science and Technology Corporation (JST), University of Tsukuba, Tsukuba 305-8573, Japan
  • Department of Chemistry and Biotechnology, Graduate School of Engineering, The University of Tokyo, Hongo, Tokyo 113-8656, Japan

  • *Author to whom correspondence should be addressed. Electronic address: ykuk@phya.snu.ac.kr

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Vol. 60, Iss. 24 — 15 December 1999

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