Method for detecting subtle spatial structures by fluctuation microscopy

Toshiya Iwai, P. M. Voyles, J. Murray Gibson, and Yoshitsugu Oono
Phys. Rev. B 60, 191 – Published 1 July 1999
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Abstract

Subtle spatial structures are often reflected on higher-order correlations. Fluctuation microscopy is a good method for detecting such spatial structures in disordered materials, because the method detects the contribution of the fourth-order density distribution function. We propose an improvement for fluctuation microscopy that increases its sensitivity to subtle spatial structures by enhancing the contributions of both the third- and the fourth-order density cumulant functions to the observable. We demonstrate numerically that the proposed method provides better detection of subtle structural changes than the original approach with improved stability against experimental noise. Although we illustrate the method in terms of transmission electron microscopy, it is not confined to this microscopy.

  • Received 15 January 1999

DOI:https://doi.org/10.1103/PhysRevB.60.191

©1999 American Physical Society

Authors & Affiliations

Toshiya Iwai

  • Department of Applied Physics, Tohoku University, Sendai 980-8579, Japan
  • Department of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801

P. M. Voyles, J. Murray Gibson, and Yoshitsugu Oono

  • Department of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801

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Issue

Vol. 60, Iss. 1 — 1 July 1999

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