Magneto-optical studies of the correlation between interface microroughness parameters and the photoluminescence line shape in $\mathrm{GaAs}/{\mathrm{Ga}}_{0.7}{\mathrm{Al}}_{0.3}\mathrm{As}$ quantum wells

In this work we analyze the relation between the interface microroughness and the full width at half maximum (FWHM) of the photoluminescence (PL) spectra for a $\mathrm{GaAs}/{\mathrm{Ga}}_{0.7}{\mathrm{Al}}_{0.3}\mathrm{As}$ multiple quantum well (QW) system. We show that, in spite of the complex correlation between the microscopic interface-defects parameters and the QW optical properties, the Singh and Bajaj model [Appl. Phys. Lett. 44, 805 (1984)] provides a good quantitative description of the excitonic PL-FWHM.