Carrier capture and escape in InxGa1xAs/GaAs quantum dots: Effects of intermixing

S. Marcinkevičius and R. Leon
Phys. Rev. B 59, 4630 – Published 15 February 1999
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Abstract

We have investigated photoexcited carrier dynamics in as-grown and intermixed InxGa1xAs/GaAs quantum dots and quantum wells by time-resolved photoluminescence with subpicosecond temporal resolution. Experiments were performed at high excitation in the temperature range 60–300 K. At lower temperatures, carrier lifetime in the dots is determined by radiative recombination, while at temperatures over 150 K carrier thermal emission becomes dominant. Carrier capture into the dots was found to be fast and governed by carrier-carrier scattering. In particular, at room temperature and high-excitation intensity, the carrier capture time of 0.72 ps was observed for the intermixed dots.

  • Received 6 July 1998

DOI:https://doi.org/10.1103/PhysRevB.59.4630

©1999 American Physical Society

Authors & Affiliations

S. Marcinkevičius

  • Department of Physics-Optics, Royal Institute of Technology, Stockholm, Sweden

R. Leon

  • Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, Pasadena, California 91109-8099

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Vol. 59, Iss. 7 — 15 February 1999

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